Summary
R-PODID (Reliable Powerdown for Industrial Drives) aims to develop an automated, cloudless, short-term fault-prediction for electric drives, power modules, and power devices, that can be integrated into power converters.
Thereby, electrical and mechanical faults of machines and of the power converters driving them will become predictable within a limited prediction horizon of 12-24h.
This will enable a power-saving shutdown of a larger number of production machines during idle times, because a looming failure during the next power-on cycle can be reliably foreseen.
It will also enable reliable mitigation of dangerous faults in applications using modern power-devices like silicon-carbide (SiC) and III/V-semiconductor devices like gallium-nitride (GaN).
Thereby, electrical and mechanical faults of machines and of the power converters driving them will become predictable within a limited prediction horizon of 12-24h.
This will enable a power-saving shutdown of a larger number of production machines during idle times, because a looming failure during the next power-on cycle can be reliably foreseen.
It will also enable reliable mitigation of dangerous faults in applications using modern power-devices like silicon-carbide (SiC) and III/V-semiconductor devices like gallium-nitride (GaN).
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More information & hyperlinks
Web resources: | https://cordis.europa.eu/project/id/101112338 |
Start date: | 01-09-2023 |
End date: | 31-08-2026 |
Total budget - Public funding: | 23 702 999,96 Euro - 7 213 403,00 Euro |
Cordis data
Original description
R-PODID (Reliable Powerdown for Industrial Drives) aims to develop an automated, cloudless, short-term fault-prediction for electric drives, power modules, and power devices, that can be integrated into power converters.Thereby, electrical and mechanical faults of machines and of the power converters driving them will become predictable within a limited prediction horizon of 12-24h.
This will enable a power-saving shutdown of a larger number of production machines during idle times, because a looming failure during the next power-on cycle can be reliably foreseen.
It will also enable reliable mitigation of dangerous faults in applications using modern power-devices like silicon-carbide (SiC) and III/V-semiconductor devices like gallium-nitride (GaN).
Status
SIGNEDCall topic
HORIZON-KDT-JU-2022-2-RIA-Topic-1Update Date
31-07-2023
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