A semi-analytical approach for the characterization of ordered 3D nano structures using grazing-incidence X-ray fluorescence

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Authors: Nikolaev, K. V.; Soltwisch, V.; Hoenicke, P.; Scholze, F.; de la Rie, J.; Yakunin, S. N.; Makhotkin, I. A.; van de Kruijs, R. W. E.; Bijkerk, F.

Journal title: Journal of Synchrotron Radiation

Journal number: 27

Journal publisher: Blackwell Publishing Inc.

Published year: 2020

Published pages: 386-395

DOI identifier: 10.1107/s1600577519016345

ISSN: 0909-0495