Chasing Abnormalities on Time Series for Predictive Maintenance and Advanced Process Control

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Authors: C. Girou, F. Bergeret, D. Pagano, P. Vasquez, G. Prinzivalli, G. Tochino

Journal title: 20th European Advanced Process Control and Manufacturing Conference (apc|m)

Journal publisher: APCM - Silicon Saxony

Published year: 2022