Summary
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Authors: S. B. Dias; E. Konstantinidis; J. A. Diniz; P. Bamidis; V. Charisis; S. Hadjidimitriou; M. Stadtschnitzer; P. Fagerberg; I. Ioakeimidis; K. Dimitropoulos; N. Grammalidis; L. J. Hadjileontiadis
Journal publisher: IEEE
Published year: 2017
DOI identifier: 10.5281/zenodo.1199537