Validated model of LDS and pLDS

A ray trace analysis is the process of following the paths of a large number of rays of incident radiation through the system in order to determine the number of processed rays on the surface of the LDS layer It allows absorption reflection and transmittance to be determined and therefore the optical efficiency to be calculated Using this technique a parametric analysis will be carried out and the optical properties of the system optimized The ray trace model will be extended for use in designing LDS layers with additional MNP layersThis will be completed under task 12