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Authors: Mihai Sanduleac, Lucas Pons, Giampaolo Fiorentino, Rares Pop, Mihaela Albu
Journal title: 2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings
Journal publisher: IEEE
Published year: 2016
Published pages: 1-5
DOI identifier: 10.1109/I2MTC.2016.7520459
ISBN: 978-1-4673-9220-4