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Authors: Angelo Baggini, Ingrid Weiss, Nerea Ruiz Fuente, Francisco R. Zuloaga, Tomas Jezdinsky, Franco Bua
Journal title: 2018 AEIT International Annual Conference
Journal publisher: IEEE
Published year: 2018
Published pages: 1-6
DOI identifier: 10.23919/aeit.2018.8577387
ISBN: 978-8-8872-3740-5