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Authors: Bei Chen, Bradley Eck, Francesco Fusco, Robert Gormally, Mark Purcell, Mathieu Sinn, Seshu Tirupathi
Journal title: 2018 IEEE International Conference on Data Mining Workshops (ICDMW)
Journal publisher: IEEE
Published year: 2018
Published pages: 1487-1492
DOI identifier: 10.1109/icdmw.2018.00213
ISBN: 978-1-5386-9288-2
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