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Authors: S. Boersma, B.M. Doekemeijer, P.M.O. Gebraad, P.A. Fleming, J. Annoni, A.K. Scholbrock, J.A. Frederik, J-W. van Wingerden
Journal title: 2017 American Control Conference (ACC)
Journal publisher: IEEE
Published year: 2017
Published pages: 1-18
DOI identifier: 10.23919/acc.2017.7962923
ISBN: 978-1-5090-5992-8