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Authors: Steffen Raach, Jan-Willem van Wingerden, Sjoerd Boersma, David Schlipf, Po Wen Cheng
Journal title: 2017 American Control Conference (ACC)
Journal publisher: IEEE
Published year: 2017
Published pages: 703-708
DOI identifier: 10.23919/ACC.2017.7963035
ISBN: 978-1-5090-5992-8
