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Authors: B. M. Doekemeijer, S. Boersma, L. Y. Pao, J. W. van Wingerden
Journal title: 2017 American Control Conference (ACC)
Journal publisher: IEEE
Published year: 2017
Published pages: 19-24
DOI identifier: 10.23919/ACC.2017.7962924
ISBN: 978-1-5090-5992-8
