Dislocations imaging in low boron doped diamond epilayers using Field Emission Scanning Electron Microscopy (FE-SEM)

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Authors: C. Barbay, S. Saada, C. Mer-Calfati, S. Temgoua, J. Barjon, J.C. Arnault

Journal title: Applied Surface Science

Journal number: 495

Journal publisher: Elsevier BV

Published year: 2019

Published pages: 143564

DOI identifier: 10.1016/j.apsusc.2019.143564

ISSN: 0169-4332