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Authors: C. Bielski, V. O'Brien, C. Whitmore, K. Ylinen, I. Juga, P. Nurmi, J. Kilpinen, I. Porras, J.M. Sole, P. Gamez, M. Navarro, A. Alikadic, A. Gobbi, C. Furlanello, G. Zeug, M. Weirathe, J. Martinez, R. Yuste, S. Castro, V. Moreno, T. Velin, C. Rossi
Journal title: 2017 IEEE International Conference on Big Data (Big Data)
Journal publisher: IEEE
Published year: 2017
Published pages: 3705-3712
DOI identifier: 10.1109/BigData.2017.8258367
ISBN: 978-1-5386-2715-0