Investigation of atomic-layer-deposited TiO x as selective electron and hole contacts to crystalline silicon

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Authors: Takuya Matsui, Martin Bivour, Paul Ndione, Paul Hettich, Martin Hermle

Journal title: Energy Procedia

Journal number: 124

Journal publisher: Elsevier

Published year: 2017

Published pages: 628-634

DOI identifier: 10.1016/j.egypro.2017.09.093

ISSN: 1876-6102