New Characterization Method for Determination of Surface Recombination Rate of Carrier Selective Junctions

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Authors: Andrej Čampa, Franc Smole, Marko Topič

Journal title: Silicon PV 2019

Journal number: Mon, April 08; 13:00-14:00 – Poster Session 1: S1-03

Journal publisher: N/C

Published year: 2019