Minority carrier diffusion length, lifetime and mobility in p-type GaAs and GaInAs

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Authors: M. Niemeyer, J. Ohlmann, A. W. Walker, P. Kleinschmidt, R. Lang, T. Hannappel, F. Dimroth, D. Lackner

Journal title: Journal of Applied Physics

Journal number: 122/11

Journal publisher: American Institute of Physics

Published year: 2017

Published pages: 115702

DOI identifier: 10.1063/1.5002630

ISSN: 0021-8979