Origin of Degradation in Si-Based All-Solid-State Li-Ion Microbatteries

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Authors: Chunguang Chen, Jos F. M. Oudenhoven, Dmitri L. Danilov, Egor Vezhlev, Lu Gao, Na Li, Fokko M. Mulder, Rüdiger-A. Eichel, Peter H. L. Notten

Journal title: Advanced Energy Materials

Journal number: 8/30

Journal publisher: Wiley-VCH Verlag

Published year: 2018

Published pages: 1801430

DOI identifier: 10.1002/aenm.201801430

ISSN: 1614-6832