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Authors: Julio C. Caiza, Yod-Samuel Martin, Danny S. Guaman, JOSE M. Del Alamo, Juan C. Yelmo
Journal title: IEEE Access
Journal number: 7
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2019
Published pages: 66512-66535
DOI identifier: 10.1109/access.2019.2918003
ISSN: 2169-3536