A Robust Data-Driven Fault Diagnosis scheme based on Recursive Dempster–Shafer Combination Rule

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Authors: N. Cartocci1, M.R. Napolitano2, G. Costante1, F. Crocetti1, P. Valigi1, M.L. Fravolini1 1 University of Perugia, Italy 2 West Virginia University, USA

Journal title: 29th Mediterranean Conference on Control and Automation (MED)

Journal publisher: IEEE

Published year: 2021