Comparison between the UV and X-ray Photosensitivities of Hybrid TiO2-SiO2 Thin Layers

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Authors: Maxime Royon, Francis Vocanson, Damien Jamon, Emmanuel Marin, Adriana Morana, Aziz Boukenter, Sylvain Girard, Youcef Ouerdane, François Royer, Yves Jourlin

Journal title: Materials

Journal publisher: MDPI Open Access Publishing

Published year: 2020

DOI identifier: 10.3390/ma13173730

ISSN: 1996-1944