On the Susceptibility of SRAM-Based FPGA Routing Network to Delay Changes Induced by Ionizing Radiation

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Authors: Mostafa Darvishi, Yves Audet, Yves Blaquiere, Claude Thibeault, Simon Pichette

Journal title: IEEE Transactions on Nuclear Science

Journal number: 66/3

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

Published pages: 643-654

DOI identifier: 10.1109/tns.2019.2898894

ISSN: 0018-9499