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Authors: Eva Arias-de-Reyna, Davide Dardari, Pau Closas, Petar M. Djuric
Journal title: 2018 IEEE Statistical Signal Processing Workshop (SSP)
Journal publisher: IEEE
Published year: 2018
Published pages: 658-662
DOI identifier: 10.1109/SSP.2018.8450840
ISBN: 978-1-5386-1571-3