Fine-Grained vs. Average Reliability for V2V Communications around Intersections

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Authors: Mouhamed Abdulla, Henk Wymeersch

Journal title: 2017 IEEE Globecom Workshops (GC Wkshps)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-5

DOI identifier: 10.1109/GLOCOMW.2017.8269131

ISBN: 978-1-5386-3920-7