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Authors: David Hind, Chris Gerada, Michael Galea, James Borg Bartolo, Matthias Fabian, Tong Sun, Kenneth T. V. Grattan
Journal title: 2017 IEEE 11th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)
Journal publisher: IEEE
Published year: 2017
Published pages: 208-212
DOI identifier: 10.1109/demped.2017.8062357
ISBN: 978-1-5090-0409-6
