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Authors: Bassem Mouawad, Robert Skuriat, Jianfeng Li, C. Mark Johnson, Christina DiMarino
Journal title: 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD)
Journal publisher: IEEE
Published year: 2018
Published pages: 256-259
DOI identifier: 10.1109/ispsd.2018.8393651
ISBN: 978-1-5386-2927-7
