Analytical Model of Power MOSFET Switching Losses due to Parasitic Components

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Authors: Edoardo Locorotondo, Luca Pugi, Fabio Corti, Lorenzo Becchi, Francesco Grasso

Journal title: 2019 IEEE 5th International forum on Research and Technology for Society and Industry (RTSI)

Journal publisher: IEEE

Published year: 2019

Published pages: 331-336

DOI identifier: 10.1109/RTSI.2019.8895562

ISBN: 978-1-7281-3815-2