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Authors: Florian Damerow, Tim Puphal, Yuda Li, Julian Eggert
Journal title: 2017 IEEE International Conference on Vehicular Electronics and Safety (ICVES)
Journal publisher: IEEE
Published year: 2017
Published pages: 178-184
DOI identifier: 10.1109/ICVES.2017.7991922
ISBN: 978-1-5090-5677-4