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Authors: Tim Puphal, Malte Probst, Yiyang Li, Yosuke Sakamoto, Julian Eggert
Journal title: 2018 IEEE Intelligent Vehicles Symposium (IV)
Journal publisher: IEEE
Published year: 2018
Published pages: 1704-1710
DOI identifier: 10.1109/ivs.2018.8500667
ISBN: 978-1-5386-4452-2