Coupling loss at the end connections of REBCO stacks: 2D modelling and measurement

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Authors: Shuo Li, Ján Kováč, Enric Pardo

Journal title: Superconductor Science and Technology

Journal number: 33/7

Journal publisher: Institute of Physics Publishing

Published year: 2020

Published pages: 075014

DOI identifier: 10.1088/1361-6668/ab9027

ISSN: 0953-2048