A New Method for Semi-Automatic Identification and Pre-Screening of Deformational Processes Over Wide Areas Using Persistent Scatterer Interferometry Datasets.

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Authors: Tomás R. et al.

Journal title: Remote Sensing Journal (MDPI)

Journal number: Bimonthly

Journal publisher: Multidisciplinary Digital Publishing Institute (MDPI)

Published year: 2019

ISSN: 2072-4292