TEM investigation of interface layers in doped ZnO / (n-type) GaN heterostructures

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Authors: K. Vaideeswaran, I. Marozau, G. Christmann, S. Nicolay, J. Dutson, S. Thornley, M. Hopkins, O. Sereda, M. Dadras

Journal title: Microscopy Conference 2017

Journal number: Microscopy Conference 2017

Journal publisher: Microscopy Conference 2017

Published year: 2017