Market Trends in Smartphone Design and Reliability Testing

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Authors: Christian Clemm, Anton Berwald, Carolin Prewitz, Nils F. Nissen, Martin Schneider-Ramelow

Journal title: Electronics Goes Green 2020+

Journal publisher: Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration

Published year: 2020

ISBN: 978-3-8396-1659-8