Assessment of the influencing parameters of the tumble test for robustness testing of smartphones

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Authors: Tom Dobs, David Sánchez, Karsten Schischke, Olaf Wittler, Martin Schneider-Ramelow

Journal title: Electronics Goes Green 2020+

Journal publisher: Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration

Published year: 2020

ISBN: 978-3-8396-1659-8