RepMet: Representative-based metric learning for classification and few-shot object detection

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Authors: Leonid Karlinsky, Joseph Shtok, Sivan Hararym Eli Schwartz, Amit Aides, Rogerio Feris (IBM) Raja Giryes (Tel-Aviv), Alex Bronstein (Technion)

Journal title: CVPR 2019

Journal publisher: CVPR 2019

Published year: 2018