Summary
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Authors: D. Rossi, F. Conti, M. Eggiman, A. Di Mauro, G. Tagliavini, S. Mach, M. Guermandi, A. Pullini, I. Loi, J. Chen, E. Flamand, L. Benini
Journal title: IEEE Journal of Solid-State Circuits
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2022
DOI identifier: 10.1109/jssc.2021.3114881
ISSN: 0018-9200