From technology assessment to responsible research and innovation (RRI)

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Authors: John Pearson, Robert Gianni, Veikko Ikonen, Hossam Haick

Journal title: 2016 Future Technologies Conference (FTC)

Journal publisher: IEEE

Published year: 2016

Published pages: 1189-1198

DOI identifier: 10.1109/FTC.2016.7821752

ISBN: 978-1-5090-4171-8