From 3D Point Cloud Data to Ray-tracing Multi-band Simulations in Industrial Scenario

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Authors: Han Niu, Diego Dupleich, Yanneck Volker-Schoneberg, Alexander Ebert, Robert Muller, Joseph Eichinger, Alexander Artemenko, Giovanni Del Galdo, Reiner S. Thoma

Journal title: https://ieeexplore.ieee.org/xpl/conhome/9860273/proceeding

Journal number: 1

Journal publisher: IEEE

Published year: 2022

Published pages: 1-5

DOI identifier: 10.1109/vtc2022-spring54318.2022.9861002

ISBN: 978-1-6654-8243-1