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Authors: W. Bogaerts, M. Wang, H. Deng, X. Chen, L. Van Iseghem, I. Zand, A. Ribeiro, A. Diaz Tormo, U. Khan
Journal publisher: IEEE
Published year: 2020
DOI identifier: 10.1109/ipc47351.2020.9252475
ISBN: 978-1-7281-5891-4
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