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Authors: A.Y. Takabayashi, D. Silva, H. Sattari, P. Edinger, P. Verheyen, K.B. Gylfason, W. Bogaerts, N. Quack
Journal title: 2022 IEEE 35th International Conference on Micro Electro Mechanical Systems Conference (MEMS)
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/mems51670.2022.9699708
ISBN: 978-1-6654-0911-7