De-RISC: A Complete RISC-V Based Space-Grade Platform

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Authors: Wessman, Nils-Johan; Malatesta, Fabio; Ribes, Stefano; Andersson, Jan; García Vilanova, Antonio; Masmano Tello, Miguel; Nicolau Gallego, Vicente; Gómez Molinero, Paco; Le Rhun, Jimmy; Alcaide Portet, Sergi; Cabo Pitarch, Guillem; Bas Jalón, Francisco; Benedicte Illescas, Pedro; Mazzocchetti, Fabio; Abella Ferrer, Jaume

Journal title: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Journal number: 1

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.23919/date54114.2022.9774557