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Authors: Daniele De Gregorio; Riccardo Zanella; Gianluca Palli; Luigi Di Stefano
Journal title: 25th International Conference on Pattern Recognition, ICPR 2020
Journal number: 3
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/icpr48806.2021.9411912
ISSN:1051-4651
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