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Authors: SIMON BENKNER, ALEXANDER HERZOG, STEFAN KLIR, WILLEM D. VAN DRIEL, AND TRAN QUOC KHANH
Journal title: IEEE Access
Journal number: 21693536
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2022
DOI identifier: 10.1109/access.2022.3197280
ISSN: 2169-3536