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Authors: M.Cretu; LDarabant; L.Czumbil; A.Ceclan; D.Stet; D.D.Micu
Journal title: Proceedings of the 12th International Symposium on Advanced Topics in Electrical Engineering (ATEE)
Journal publisher: IEEE
Published year: 2021
DOI identifier: 10.1109/atee52255.2021.9425338