Misalignments Characterization in Micro-CPV Modules with Deep Learning compared with Electrical Performance Parameters

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Authors: Luis San José, Guido Vallerotto, Rebeca Herrero, Ignacio Antón

Journal title: AIP Conference Proceedings 2550, 030003 (2022) (CPV-17)

Journal publisher: American Insitute of Physics (AIP)

Published year: 2022

DOI identifier: 10.1063/5.0100320

ISBN: 978-0-7354-4392-1