Summary
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Authors: M. Dal Borgo, U. Musella, L. Staibano, P. dell’Aversana, M. Alvarez Blanco, R. Bianco, B. Pluymers, B. Peeters, S. Nocerino, B. De Maio
Journal publisher: SIEMENS
Published year: 2022
DOI identifier: 10.5281/zenodo.7194492
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