Feasibility of Wafer Exchange for European Edge AI Pilot Lines

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Authors: Annika Franziska Wandesleben, Delphine Truffier-Boutry, Varvara Brackmann, Benjamin Lilienthal-Uhlig, Manoj Jaysnkar, Stephan Beckx, Ivan Madarevic, Audde Demarest, Bernd Hintze, Franck Hochschulz, Yannick Le Tiec, Alessio Spessot, and Fabrice Nemouchi

Journal title: Industrial Artificial Intelligence Technologies and Applications

Journal publisher: River Publishers

Published year: 2022

ISBN: 9788770227919