Summary
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Authors: Ioanna D. Pasiopoulou, Styliani A. Vomva, Grigoris K. Papagiannis, Αggelos S. Bouhouras, Stavros P. Filippidis, Georgios C. Christoforidis
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/upec55022.2022.9917703