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Authors: Stavros P. Filippidis, Nikolaos Kelepouris, Αggelos S. Bouhouras, Georgios C. Christoforidis, Styliani A. Vomva, Ioanna D. Pasiopoulou, Grigoris K. Papagiannis
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/upec55022.2022.9917591
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