Security Context migration in MEC: challenges and use cases

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Authors: - Krzysztof Bocianiak - Rafał Artych - Jean-Philippe Wary et al.

Journal title: Electronics 2022, 11(21)

Journal publisher: Zhonghua ji zhen yi xue za zhi bian ji bu

Published year: 2022

DOI identifier: 10.3390/electronics11213512

ISSN: 1671-0282