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Authors: Markus Murtinger; Jakob Uhl, Helmut Schrom-Feiertag, Quynh Nguyen, Birgit Harthum, Manfred Tscheligi
Journal title: 2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/metroxraine54828.2022.9967532